%0 Journal Article
%@holdercode {isadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S}
%@nexthigherunit 8JMKD3MGPCW/3ESGTTP
%3 1-s2.0-S0378437107009557-main.pdf
%X This paper introduces a relative structural complexity measure for the characterization of disordered surfaces. Numerical solutions of 2d+1 KPZ equation and scanning force microscopy (SFM) patterns of porous silicon samples are analyzed using this methodology. The results and phenomenological interpretation indicate that the proposed measure is efficient for quantitatively characterize the structural complexity of disordered surfaces (and interfaces) observed and/or simulated in nano, micro and ordinary scales.
%8 Dec.
%N 2
%T Structural complexity of disordered surfaces: Analyzing the porous silicon SFM patterns
%K disordered surfaces, structural complexity, gradient pattern analysis, wavelet multiresolution analysis, Euler characteristic, KPZ equation, porous silicon.
%@secondarytype PRE PI
%@archivingpolicy denypublisher denyfinaldraft24
%@usergroup administrator
%@usergroup marciana
%@usergroup simone
%@group LAC-INPE-MCT-BR
%@group LAC-INPE-MCT-BR
%@secondarykey INPE--PRE/
%@issn 0378-4371
%2 sid.inpe.br/mtc-m17@80/2007/12.20.13.30.39
%@affiliation Instituto Nacional de Pesquisas Espaciais (INPE)
%@affiliation Instituto Nacional de Pesquisas Espaciais (INPE)
%@affiliation Instituto de Física, Instituto Tecnológico de Aeronáutica (ITA)
%@affiliation Instituto de Física, Universidade Federal da Bahia
%@affiliation Departamento de Física, Universidade Federal do Paraná
%@affiliation COPPE, Universidade Federal do Rio de Janeiro
%@affiliation IP&D, Universidade do Vale do Paraíba (UNIVAP)
%B Physica A: Statistical Mechanics and its Applications
%@versiontype publisher
%P 666-673
%4 sid.inpe.br/mtc-m17@80/2007/12.20.13.30
%@documentstage not transferred
%D 2007
%V 386
%@doi 10.1016/j.physa.2007.08.044
%A Rosa, Reinaldo Roberto,
%A Baroni, Mariana Pelissari Monteiro Aguiar,
%A Zaniboni, G. T.,
%A Silva, A. Ferreira da,
%A Roman, L. S.,
%A Pontes, J.,
%A Bolzan, M. J. A.,
%@dissemination WEBSCI; PORTALCAPES; COMPENDEX.
%@area COMP